Testing Sequence Dependent Defects Год выпуска: 2010Автор: Narendra Devta-PrasannaИздательство: LAP Lambert Academic PublishingСтраниц: 116ISBN: 9783838312194Описание With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
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Игорь Защитили на "хорошо", нас всё устраивает - спасибо! :)... Видимо, эта же тема и будет дипломом - если Вы не против, мы бы не отказались от Вашей помощи... :)
