Год выпуска: 2013 Автор: Alaa Jabbar Ghazai,Haslan Abo Hassan and Z. Hassan Издательство: LAP Lambert Academic Publishing Страниц: 212 ISBN: 9783659351051
Описание
The objective of this book is to characterize the optoelectronic properties of quaternary n-Al0.08In0.08Ga0.84N thin films grown via plasma assistance molecular beam epitaxy on sapphire (Al2O3) and silicon (Si) substrates for different optoelectronic applications, including Al0.08In0.08Ga0.84N (MSM) photodetectors (PDs), solar cells and multi-quantum well (MQW) laser diodes (LDs). Defect-free films with high structural, optical and electrical qualities were obtained. X-ray diffraction analysis was used to characterize small full width at half maximum intensity of diffraction peaks, low compressive strain, relatively large grain size and low dislocation density which produced smooth surfaces without any phases separation or cracks. Scanning electron microscopy, energy-dispersive X-ray microscopy and atomic force microscopy images confirmed these characterizations. Furthermore, high optical quality, as well as high absorption and absorption coefficients were observed using PL and...
