Surface Roughness Study by Atomic Force Microscopy Год выпуска: 2012Автор: Md.Abu Sayeed and Zakia FerdousИздательство: LAP Lambert Academic PublishingСтраниц: 72ISBN: 9783848400355Описание AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.
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Елена, 25.02 Огромнейшее преогромнейшее Вам спасибо! Защитилась на 5! :)
