Digital Circuit Testing
Год выпуска: 2010
Автор: Francis C. Wong
Издательство:
Страниц: 228
ISBN: 9780127345802
Описание Digital Circuit Testing |
Похожие книги - Joseph A. Risse. CET Study Guide. – М.: , 0. – 0 с.
- Daniel M. Kaplan, Christopher White. Hands-On Electronics: A Practical Introduction to Analog and Digital Circuits. – М.: Cambridge University Press, 2003. – 226 с.
- Crash Course in Electronics Technology. – М.: , 0. – 0 с.
- John Reeder. Using MultiSIM: Digital Electronics. – М.: , 0. – 0 с.
- Tsutomu Sasao, Jon T. Butler. Progress in Applications of Boolean Functions (Synthesis Lectures on Digital Circuits and Systems). – М.: , 2010. – 154 с.
- Pong P. Chu. FPGA Prototyping By Verilog Examples. – М.: , 2008. – 518 с.
- Francis C. Wong. Digital Circuit Testing. – М.: , 2010. – 228 с.
- Electronic Circuits For The Evil Genius 2/E. – М.: , 2011. – 320 с.
- Mohammad Arif Sobhan Bhuiyan,Md. Mizanur Rahman Chy and Md. Nizam Uddin. Multiscale Digital Thermometer. – М.: LAP Lambert Academic Publishing, 2012. – 60 с.
- Sandip Sahoo and Ashish Kumar Ram. Optimization of Circuit Placement on FPGA. – М.: LAP Lambert Academic Publishing, 2012. – 52 с.
- Jaber Al-Balushi and Afaq Ahmad. Response Data Compression Techniques in Digital Circuit Testing. – М.: LAP Lambert Academic Publishing, 2014. – 96 с.
- Manu Sudhan and Sowmya Sudhan S. VLSI-Analog & Digital Design. – М.: LAP Lambert Academic Publishing, 2011. – 104 с.
- Abdulkadir Utku Diril. Techniques for Power and Reliability Optimization of CMOS Logic. – М.: LAP Lambert Academic Publishing, 2012. – 108 с.
- Suman Nehra,Krishna Gopal Sharma and Tripti Sharma. High Performance Domino Logic Circuits in Low Power VLSI Design. – М.: LAP Lambert Academic Publishing, 2012. – 68 с.
- Michal Widlok. Advanced digital-analogue Galvoscanner position control system. – М.: LAP Lambert Academic Publishing, 2010. – 100 с.
- Rania F. Ahmed,Ahmed M. Soliman and Ahmed G. Radwan. Testing Methods For Fault Detection In Electronic Circuits. – М.: LAP Lambert Academic Publishing, 2014. – 184 с.
- Slawosz Uznanski. Single Event Upsets in Sub-65nm CMOS technologies. – М.: LAP Lambert Academic Publishing, 2011. – 192 с.
Задайте свой вопрос по вашей теме
|
|
|
