SEM, EDAX & AFM study of ZnTe films deposited using SILAR method Год выпуска: 2014Автор: Jignesh RathodИздательство: LAP Lambert Academic PublishingСтраниц: 64ISBN: 9783659258299Описание In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.
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Wufoo Хочу выразить искреннюю благодарность Юлии Владимировне К. за грамотную и оперативную помощь. Как всегда, дотянула до последнего. Буквально за 4 дня получила необходимый мне материал. Спасибо за квалифицированные и быстрые ответы на мои вопросы и за понимание преддипломного состояния ваших клиентов.
