Год выпуска: 2012 Автор: Swarnendu Biswas Издательство: LAP Lambert Academic Publishing Страниц: 140 ISBN: 9783847345787
Описание
In the recent past, there has been a rapid surge in the usage and reach of embedded applications. Embedded applications are now being used in different fields ranging from home appliances to even safety-critical areas such as health-care instruments, avionics, etc. Embedded systems used in safety-critical applications are required to have far greater reliability than conventional applications. Developing effective regression testing techniques for evolving embedded software is a problem of practical significance. Improved regression testing techniques will help to improve the quality of embedded software, and will also help reduce software maintenance costs. This book talks about improved regression testing techniques for embedded software. More specifically, we discuss regression test selection and optimization approaches suited for embedded software.
